• 文献标题:   Wafer-scale epitaxial single-crystalline Ni(111) films on sapphires for graphene growth
  • 文献类型:   Article
  • 作  者:   HU YG, PENG JP, PAN MC, QIU WC, WU RN, HU JF, HU N, CHENG FY, HUANG R, LI FS, CHEN DX, ZHANG Q, LI PS
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF MATERIALS SCIENCE
  • ISSN:   0022-2461 EI 1573-4803
  • 通讯作者地址:   Natl Univ Def Technol
  • 被引频次:   0
  • DOI:   10.1007/s10853-020-05450-4 EA OCT 2020
  • 出版年:   2021

▎ 摘  要

The growth of graphene on Ni magnetic films is of great significance for graphene spintronics, whereas the existence of grain boundaries and twin crystal structures in Ni films is an obstacle for obtaining the large-scale and uniform graphene. In this paper, an epitaxial wafer-scale single-crystalline Ni(111) film with the flat and clean surface was successfully prepared on the commercial alpha-Al2O3(0001) substrate by a two-step method, which was demonstrated with several characterization methods. According to the abnormal grain growth mechanism, the clean and uniform sapphire surface plays a key role for the single crystallization of Ni films as it induces a weak interface energy difference between two atomic stacking structures (ABC and ACB), thus stimulating the evolution of Ni films from (111) out-of-plane textures to single crystals. Furthermore, an ultra-flat and wrinkle-free graphene monolayer was synthesized on the prepared Ni film, which further verified its high quality and effectiveness.