• 文献标题:   Activating "Invisible" Glue: Using Electron Beam for Enhancement of Interfacial Properties of Graphene-Metal Contact
  • 文献类型:   Article
  • 作  者:   KIM S, RUSSELL M, KULKARNI DD, HENRY M, KIM S, NAIK RR, VOEVODIN AA, JANG SS, TSUKRUK VV, FEDOROV AG
  • 作者关键词:   focused electron beam induced deposition febid, graphene, graphitic interlayer, heterogeneous contact, nanowelding
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Georgia Inst Technol
  • 被引频次:   8
  • DOI:   10.1021/acsnano.5b06342
  • 出版年:   2016

▎ 摘  要

Interfacial contact of two-dimensional graphene with three-dimensional metal electrodes is crucial to engineering high-performance graphene-based nanodevices with superior performance. Here, we report on the development of a rapid "nanowelding" method for enhancing properties of interface to graphene buried under metal electrodes using a focused electron beam induced deposition (FEBID). High energy electron irradiation activates two-dimensional graphene structure by generation of structural defects at the interface to metal contacts with subsequent strong bonding via FEBID of an atomically thin graphitic interlayer formed by low energy secondary electron-assisted dissociation of entrapped hydrocarbon contaminants. Comprehensive investigation is conducted to demonstrate formation of the FEBID graphitic interlayer and its impact on contact properties of graphene devices achieved via strong electromechanical coupling at graphene metal interfaces. Reduction of the device electrical resistance by similar to 50% at a Dirac point and by similar to 30% at the gate voltage far from the Dirac point is obtained with concurrent improvement in thermomechanical reliability of the contact interface. Importantly, the process is rapid and has an excellent insertion potential into a conventional fabrication workflow of graphene-based nanodevices through single-step postprocessing modification of interfacial properties at the buried heterogeneous contact.