• 文献标题:   Low-Temperature Growth of Graphene on a Semiconductor
  • 文献类型:   Article
  • 作  者:   ROST HI, CHELLAPPAN RK, STRAND FS, GRUBISICCABO A, REED BP, PRIETO MJ, TANASE LC, CALDAS LD, WONGPINIJ T, EUARUKSAKUL C, SCHMIDT T, TADICH A, COWIE BCC, LI ZS, COOIL SP, WELLS JW
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF PHYSICAL CHEMISTRY C
  • ISSN:   1932-7447 EI 1932-7455
  • 通讯作者地址:  
  • 被引频次:   5
  • DOI:   10.1021/acs.jpcc.0c10870 EA FEB 2021
  • 出版年:   2021

▎ 摘  要

The industrial realization of graphene has so far been limited by challenges related to the quality, reproducibility, and high process temperatures required to manufacture graphene on suitable substrates. We demonstrate that epitaxial graphene can be grown on transition-metal-treated 6H-SiC(0001) surfaces, with an onset of graphitization starting around 450-500 degrees C. From the chemical reaction between SiC and thin films of Fe or Ru, sp(3) carbon is liberated from the SiC crystal and converted to sp(2) carbon at the surface. The quality of the graphene is demonstrated by using angle-resolved photoemission spectroscopy and low-energy electron diffraction. Furthermore, the orientation and placement of the graphene layers relative to the SiC substrate are verified by using angle-resolved absorption spectroscopy and energy-dependent photoelectron spectroscopy, respectively. With subsequent thermal treatments to higher temperatures, a steerable diffusion of the metal layers into the bulk SiC is achieved. The result is graphene supported on magnetic silicide or optionally, directly on semiconductor, at temperatures ideal for further large-scale processing into graphene-based device structures.