• 文献标题:   Recognition of Defect Structure of Graphene by Image Processing Technique
  • 文献类型:   Article
  • 作  者:   WANG MF, LIU QJ, FENG JL, JIANG QG, ZOU XP, PAN JJ
  • 作者关键词:   graphene, defect, topology structure, amount of atom
  • 出版物名称:   JOURNAL OF COMPUTATIONAL THEORETICAL NANOSCIENCE
  • ISSN:   1546-1955 EI 1546-1963
  • 通讯作者地址:   Inst Disaster Prevent
  • 被引频次:   1
  • DOI:   10.1166/jctn.2014.3365
  • 出版年:   2014

▎ 摘  要

In order to extract defect structure of graphene, a method based on a series of digital image processing algorithms was proposed in this paper. Using the method, we can automatically analyze topology defect structure and calculate amount of atoms. At last, we also write the correlative software with c++, which applies the digital image processing algorithms, and give out the processing result of several classic TEM image of graphene.