• 文献标题:   Formation and Characterization of Wrinkle Structures of Chemically-Derived Graphene Thin Films and Micropatterns
  • 文献类型:   Article
  • 作  者:   KIM NH, KO Y, CHO SR, CHANG ST
  • 作者关键词:   reduced graphene oxide, wrinkle, thin film, micropattern
  • 出版物名称:   JOURNAL OF NANOSCIENCE NANOTECHNOLOGY
  • ISSN:   1533-4880 EI 1533-4899
  • 通讯作者地址:   Chung Ang Univ
  • 被引频次:   4
  • DOI:   10.1166/jnn.2014.7870
  • 出版年:   2014

▎ 摘  要

In this study, we report a simple and effective process for the fabrication of wrinkle structures of chemically derived graphene thin films and patterns. Reduced graphene oxide (rGO) thin films/patterns formed on glass substrates are transferred to pre-strained elastomeric layers by improving adhesion strength at the rGO/PDMS interface with the assistance of oxygen plasma treatment. The morphology of rGO wrinkle structures is investigated in the various applied strains and film thicknesses. The experimental results were interpreted by theoretical models and well fitted to the estimated values. The techniques for such well-defined rGO wrinkle structures could be used for flexible and stretchable graphene-based electronic devices.