• 文献标题:   Freestanding graphene writing on a silicon carbide wafer
  • 文献类型:   Article
  • 作  者:   KIM EH, AHN JR, PARK JH, KHADK IB, SON J, KIM HW, LEE DH, KIM BJ, SUNG DI, WOO SH, YEOM GY, PARK SH, AHN JR
  • 作者关键词:   freestanding graphene, graphene, raman spectroscopy
  • 出版物名称:   CURRENT APPLIED PHYSICS
  • ISSN:   1567-1739 EI 1878-1675
  • 通讯作者地址:   Sungkyunkwan Univ
  • 被引频次:   0
  • DOI:   10.1016/j.cap.2020.09.010
  • 出版年:   2020

▎ 摘  要

Freestanding graphene on a trench has been fabricated extensively using a transfer process of chemical vapor deposition grown graphene. Here, we demonstrate that freestanding graphene can be grown directly on a trench without a transfer process. A shallow trench was made on a 6H-SiC(0001) wafer using a focused ion beam lithography. The shallow trench was heated to a high temperature under Ar atmosphere. The heat treatment made the shallow trench become deeper and wider. Subsequently, epitaxial graphene was floating on the trench, resulting in freestanding graphene, where underlying bulk SiC was self-etched after the growth of epitaxial graphene. The freestanding graphene on a trench was characterized using Raman spectroscopy and atomic force microscopy. Such freestanding graphene writing can be applied to semiconductor fabrication process of free-standing graphene devices without a transfer process.