• 文献标题:   Effects of chemical and physical defects on the humidity sensitivity of graphene surface
  • 文献类型:   Article
  • 作  者:   SON YJ, CHUN KY, KIM JS, LEE JH, HAN CS
  • 作者关键词:   graphene, humidity sensing, defect, poly methyl methacrylate
  • 出版物名称:   CHEMICAL PHYSICS LETTERS
  • ISSN:   0009-2614 EI 1873-4448
  • 通讯作者地址:   Korea Univ
  • 被引频次:   1
  • DOI:   10.1016/j.cplett.2017.10.028
  • 出版年:   2017

▎ 摘  要

We investigate the effect of the chemical and physical defects on the humidity sensitivity of graphene. For this we apply reactive ion etching for physical defects and the poly(methyl methacrylate) (PMMA) coating for chemical defects to the CVD graphene. The tendency of humidity sensing is hardly found by the physical defects while the distinct changes are observed with chemical defects by control of the thickness and the coverage area of the PMMA on the graphene surface. The graphenes covered with thinner or smaller area of PMMA show an enhanced humidity sensitivity, indicating the possibility of H2O sensing. (C) 2017 Elsevier B.V. All rights reserved.