• 文献标题:   Domain structures of single layer graphene imaged with conductive probe atomic force microscopy
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   KWON S, CHUNG HJ, SEO S, PARK JY
  • 作者关键词:   graphene, friction, strain, charge transport, atomic force microscopy
  • 出版物名称:   SURFACE INTERFACE ANALYSIS
  • ISSN:   0142-2421 EI 1096-9918
  • 通讯作者地址:   Korea Adv Inst Sci Technol
  • 被引频次:   14
  • DOI:   10.1002/sia.4810
  • 出版年:   2012

▎ 摘  要

We report nanoscale domain boundaries on single layer graphene probed with conductive probe atomic force microscopy in ultrahigh vacuum. Graphene was prepared using the inductively coupled plasma chemical vapor deposition technique on a copper substrate. Current mapping revealed domains 50100?nm in size on the single layer graphene. Stick slip images revealed a hexagonal structure of the graphene layer in the middle of the domain. The conductance on the domain boundary is lower than that inside the domain structure, which is associated with disorder on the boundary, while friction and adhesion measurements on the domain boundaries did not show any contrast. We found that the conductance contrast is prominent at high loads, suggesting the domain boundary plays a significant role in the charge transport properties of graphene under mechanical deformation. Copyright (c) 2012 John Wiley & Sons, Ltd.