▎ 摘　　要

This work presents a facile method based on colorimetric analysis using optical microscopy to rapidly screen large-area graphene on copper. The colorimetric technique exploits the oxidation protection offered by graphene on copper surfaces exposed to air at moderate temperatures (180 degrees C). Image processing using an RGB color model is employed to assess the level of protection. The analysis generates quantifiable results that match well with visual observations as well as Raman spectroscopy and XPS measurements. The reported method addresses a bottleneck for rapid, large-area characterization of graphene that can be integrated with scaled up roll-to-roll manufacturing processes.