• 文献标题:   Impurity-Induced Grain Boundary Strengthening in Polycrystalline Graphene
  • 文献类型:   Article
  • 作  者:   MENG FC, HU DY, SONG J
  • 作者关键词:  
  • 出版物名称:   JOURNAL OF PHYSICAL CHEMISTRY C
  • ISSN:   1932-7447 EI 1932-7455
  • 通讯作者地址:   McGill Univ
  • 被引频次:   2
  • DOI:   10.1021/acs.jpcc.5b10731
  • 出版年:   2016

▎ 摘  要

First-principles density functional theory (DFT) calculations were performed to investigate the effects of boron (B) and nitrogen (N) doping on the fracture behaviors of a series of symmetric graphene grain boundaries (STGBs) under biaxial straining. Doping was found to generally enhance the fracture strength of STGBs, which was shown to be attributed to dopants mechanically lowering the local stretching energy or chemically strengthening the critical bond. We also showed that doping may also induce crack deflection to further improve the fracture resistance of graphene grain boundaries (GBs). Furthermore, we showed that the presence of multiple B and N dopants in the pentagon-heptagon ring(s) can contribute to promoting intergranular fracture in the presence of a small prestrain along the GBs. Our findings clarify the role of B and N dopants in GBs strengthening of polycrystalline graphene.