▎ 摘　　要

Intriguing field emission microscopy (FEM) images reflecting subnanometer-sized structures of emitting sites and/or electronic orbitals have been observed from graphene edges. Graphene emitters with free edges (i.e. open edges) show a striped pattern (dubbed as a lip pattern') consisting of an array of streaked spots (or oval-shaped spots); the direction of striation is perpendicular to the graphene sheet, and each stripe is divided into two wings by a central dark band running parallel to the graphene sheet. The dark band may be due to the distractive interference of electrons emitted from orbitals with a phase difference of on either side of the graphene. From the magnification calibration using FEM images of an aluminum cluster with atomic resolution, the spacing of the streaked spots is found to be close to the distance between adjacent carbon atoms aligned along the zigzag and armchair edges. These observations suggest that the lip pattern reflects the symmetry of states strongly delocalized at edge atoms. Copyright (c) 2016 John Wiley & Sons, Ltd.