• 文献标题:   Diluted chirality dependence in edge rough graphene nanoribbon field-effect transistors
  • 文献类型:   Article
  • 作  者:   TSENG F, UNLUER D, HOLCOMB K, STAN MR, GHOSH AW
  • 作者关键词:   dislocation, elemental semiconductor, energy gap, field effect transistor, graphene, modulation, nanoelectronic, nanostructured material, tunnelling
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Univ Virginia
  • 被引频次:   25
  • DOI:   10.1063/1.3147187
  • 出版年:   2009

▎ 摘  要

We investigate the role of various structural nonidealities on the performance of armchair-edge graphene nanoribbon field effect transistors (GNRFETs). Our results show that edge roughness dilutes the chirality dependence often predicted by theory but absent experimentally. Instead, GNRs are classifiable into wide (semimetallic) versus narrow (semiconducting) strips, defining thereby the building blocks for wide-narrow-wide all-graphene devices and interconnects. Small bandgaps limit drain bias at the expense of band-to-band tunneling in GNRFETs. We outline the relation between device performance metrics and nonidealities such as width modulation, width dislocations and surface step, and nonideality parameters such as roughness amplitude and correlation length.