• 文献标题:   Graphene synthesis on SiC: Reduced graphitization temperature by C-cluster and Ar-ion implantation
  • 文献类型:   Article
  • 作  者:   ZHANG R, LI H, ZHANG ZD, WANG ZS, ZHOU SY, WANG Z, LI TC, LIU JR, FU DJ
  • 作者关键词:   graphene, sic, ion implantation, cluster, defect
  • 出版物名称:   NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION BBEAM INTERACTIONS WITH MATERIALS ATOMS
  • ISSN:   0168-583X EI 1872-9584
  • 通讯作者地址:   Wuhan Univ
  • 被引频次:   7
  • DOI:   10.1016/j.nimb.2015.04.067
  • 出版年:   2015

▎ 摘  要

Thermal decomposition of SiC is a promising method for high quality production of wafer-scale graphene layers, when the high decomposition temperature of SiC is substantially reduced. The high decomposition temperature of SiC around 1400 degrees C is a technical obstacle. In this work, we report on graphene synthesis on 6H-SiC with reduced graphitization temperature via ion implantation. When energetic Ar, C-1 and C-6-cluster ions implanted into 6H-SiC substrates, some of the Si-C bonds have been broken due to the electronic and nuclear collisions. Owing to the radiation damage induced bond breaking and the implanted C atoms as an additional C source the graphitization temperature was reduced by up to 200 degrees C. (C) 2015 Elsevier B.V. All rights reserved.