▎ 摘　　要

Cubic half-metallic Heusler alloy Co2MnSi (CMS) thin films were epitaxially grown on Ge(111) substrates via a hexagonal graphene inter-layer through the combined use of magnetron sputtering for CMS and mechanical exfoliation for graphene. Despite the graphene interlayer being inserted between the CMS film and the Ge(111) substrate, CMS films were still grown epitaxially on Ge(111) substrates with extremely smooth and abrupt interfaces. Furthermore, 111 peaks of CMS were observed by x-ray diffraction measurement, indicating the L2(1) order for CMS thin films. The saturation magnetization (M-s) of CMS films annealed at 450 degrees C was 891 emu/cm(3) at 10 K, which is correspondence to 87% of the theoretically predicted saturation magnetization value for half-metallic CMS. Published under an exclusive license by AIP Publishing.