• 文献标题:   Intercalation of metals and silicon at the interface of epitaxial graphene and its substrates
  • 文献类型:   Review
  • 作  者:   HUANG L, XU WY, QUE YD, MAO JH, MENG L, PAN LD, LI G, WANG YL, DU SX, LIU YQ, GAO HJ
  • 作者关键词:   graphene, metal intercalation, silicon intercalation, scanning tunneling microscopy
  • 出版物名称:   CHINESE PHYSICS B
  • ISSN:   1674-1056
  • 通讯作者地址:   Chinese Acad Sci
  • 被引频次:   8
  • DOI:   10.1088/1674-1056/22/9/096803
  • 出版年:   2013

▎ 摘  要

Intercalations of metals and silicon between epitaxial graphene and its substrates are reviewed. For metal intercalation, seven different metals have been successfully intercalated at the interface of graphene/Ru(0001) and form different intercalated structures. Meanwhile, graphene maintains its original high quality after the intercalation and shows features of weakened interaction with the substrate. For silicon intercalation, two systems, graphene on Ru(0001) and on Ir(111), have been investigated. In both cases, graphene preserves its high quality and regains its original superlative properties after the silicon intercalation. More importantly, we demonstrate that thicker silicon layers can be intercalated at the interface, which allows the atomic control of the distance between graphene and the metal substrates. These results show the great potential of the intercalation method as a non-damaging approach to decouple epitaxial graphene from its substrates and even form a dielectric layer for future electronic applications.