• 文献标题:   Inflating Graphene with Atomic Scale Blisters
  • 文献类型:   Article
  • 作  者:   ROBERTSON AW, HE K, KIRKLAND AI, WARNER JH
  • 作者关键词:   graphene, actem, hrtem, electron microscopy, defect, tem, dislocation
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Oxford
  • 被引频次:   27
  • DOI:   10.1021/nl404266k
  • 出版年:   2014

▎ 摘  要

Using 80 kV electron beam irradiation we have created graphene blister defects of additional carbon atoms incorporated into a graphene lattice. These structures are the antithesis of the vacancy defect with blister defects observed to contain up to six additional carbon atoms. We present aberration-corrected transmission electron microscopy data demonstrating the formation of a blister from an existing divacancy, together with further examples that undergo reconfiguration and annihilation under the electron beam. The relative stability of the observed variations of blister are discussed and considered in the context of previous calculations. It is shown that the blister defect is seldom found in isolation and is more commonly coupled with dislocations where it can act as an intermediate state, permitting dislocation core climb without the atom ejection from the graphene lattice required for nonconservative motion.