• 文献标题:   Effect of p-GaN hole concentration on the stabilization and performance of a graphene current spreading layer in near-ultraviolet light-emitting diodes
  • 文献类型:   Article
  • 作  者:   MIN JH, SEO TH, CHOI SB, KIM K, LEE JY, PARK MD, KIM MJ, SUH EK, KIM JR, LEE DS
  • 作者关键词:   pgan, hole concentration, graphene, current spreading layer, lightemitting diode
  • 出版物名称:   CURRENT APPLIED PHYSICS
  • ISSN:   1567-1739 EI 1878-1675
  • 通讯作者地址:   Gwangju Inst Sci Technol
  • 被引频次:   1
  • DOI:   10.1016/j.cap.2016.08.006
  • 出版年:   2016

▎ 摘  要

We have demonstrated the effect of p-GaN hole concentration on a graphene current spreading layer (CSL) for stabilization and improved performance of a near-ultraviolet light-emitting diode (NUV LED). While NUV LEDs with a more lightly-doped p-GaN showed poor electrical and optical properties and unstable performance, NUV LEDs with more heavily-doped p-GaN (similar to 2 x 10(17) cm(-3)) showed very stable, outstanding performance. The main factor of the improvement was the enhanced contact property between the graphene CSLs and the p-GaN that resulted from the increase of the hole concentration, which led to a thinner barrier and an enhanced current injection. From our results, we were able to determine that hole concentration as heavy as 2 x 10(17) cm(-3) in p-GaN layers is a primary condition in NUV LEDs with graphene-based CSLs. (C) 2016 Elsevier B.V. All rights reserved.