• 文献标题:   Space charge limited conduction with exponential trap distribution in reduced graphene oxide sheets
  • 文献类型:   Article
  • 作  者:   JOUNG D, CHUNDER A, ZHAI L, KHONDAKER SI
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Univ Cent Florida
  • 被引频次:   95
  • DOI:   10.1063/1.3484956
  • 出版年:   2010

▎ 摘  要

We elucidate on the low mobility and charge traps of the chemically reduced graphene oxide (RGO) sheets by measuring and analyzing temperature dependent current-voltage characteristics. The RGO sheets were assembled between source and drain electrodes via dielectrophoresis. At low bias voltage the conduction is Ohmic while at high bias voltage and low temperatures the conduction becomes space charge limited with an exponential distribution of traps. We estimate an average trap density of 1.75 x 10(16) cm(-3). Quantitative information about charge traps will help develop optimization strategies of passivating defects in order to fabricate high quality solution processed graphene devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3484956]