• 文献标题:   Analyzing Dirac Cone and Phonon Dispersion in Highly Oriented Nanocrystalline Graphene
  • 文献类型:   Article
  • 作  者:   NAI CT, XU H, TAN SJR, LOH KP
  • 作者关键词:   chemical vapor deposition, graphene, dirac cone, scanning tunneling microscopy, angleresolved photoemission spectroscopy, highresolution electron energy loss spectroscopy, phonon dispersion, ambient exposure, oxygen intercalation
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Natl Univ Singapore
  • 被引频次:   13
  • DOI:   10.1021/acsnano.5b07662
  • 出版年:   2016

▎ 摘  要

Chemical vapor deposition (CVD) is one of the most promising growth techniques to scale up the production of monolayer graphene. At present, there are intense efforts to control the orientation of graphene grains during CVD, motivated by the fact that there is a higher probability for oriented grains to achieve seamless merging, forming a large single crystal. However, it is still challenging to produce single-crystal graphene with no grain boundaries over macroscopic length scales, especially when the nucleation density of gkaphene nuclei is high. Nonetheless, nano crystalline graphene with highly oriented grains may exhibit single-crystal-like properties. Herein, we investigate the spectroscopic signatures of graphene film containing highly oriented, nanosized grains (20-150 nm) using angle-resolved photoemission spectroscopy (ARPES) and high-resolution electron energy loss spectroscopy (HREELS). The robustness of the Dirac cone, as well as dispersion of its phonons, as a:function of graphene's grain size and before and after film coalescence, was investigated. In view of the sensitivity of atomically thin graphene to atmospheric adsorbates and intercalants, ARPES and HREELS were also used to monitor the changes in spectroscopic signatures of the graphene film following exposure to.the ambient atmosphere: