▎ 摘　　要

Graphene has attracted scientific interest in recent years due to its unique properties. Reduced graphene oxide (RGO) was prepared by chemical oxidation of purified natural graphite to obtain graphite oxide then the material was exfoliated to reduced graphene nanosheets by ultrasonication and reduction process using sodium borohydride (NaBH4). The transmission electron microscopy (TEM) investigations were performed on a TEM JEOL 2100 instrument at an accelerating voltage of 200 KV. The measurements of lattice-fringe spacing recorded in High Resolution Transmission Electron Microscopy (HRTEM) micrographs were made using digital image analysis of reciprocal space parameters. The analysis was carried out by the Digital Micrograph software. The obtained selected area electron diffraction (SAED) data show unambiguously that the sample RGO is different from Graphite 2H PDF 75-1621 and has typical interplanar distance d(002) from 3.586 A up to 4.016 A. Lattice fringes obtained by HRTEM method also give additional information about interplanar distance d002 for RGO materials where the value is 3.850 A. It was established that the main phase is RGO but some impurities of Graphite is also found.