• 文献标题:   Direct measurement of quantum phases in graphene via photoemission spectroscopy
  • 文献类型:   Article
  • 作  者:   HWANG C, PARK CH, SIEGEL DA, FEDOROV AV, LOUIE SG, LANZARA A
  • 作者关键词:  
  • 出版物名称:   PHYSICAL REVIEW B
  • ISSN:   1098-0121
  • 通讯作者地址:   Univ Calif Berkeley
  • 被引频次:   39
  • DOI:   10.1103/PhysRevB.84.125422
  • 出版年:   2011

▎ 摘  要

Quantum phases provide us with important information for understanding the fundamental properties of a system. However, the observation of quantum phases, such as Berry's phase and the sign of the matrix element of the Hamiltonian between two nonequivalent localized orbitals in a tight-binding formalism, has been challenged by the presence of other factors, e. g., dynamic phases and spin or valley degeneracy, and the absence of methodology. Here, we report a way to directly access these quantum phases, through polarization-dependent angle-resolved photoemission spectroscopy (ARPES), using graphene as a prototypical two-dimensional material. We show that the momentum-and polarization-dependent spectral intensity provides direct measurements of (i) the phase of the band wavefunction and (ii) the sign of matrix elements for nonequivalent orbitals. Upon rotating light polarization by pi/2, we found that graphene with a Berry's phase of n pi (n = 1 for single-and n = 2 for double-layer graphene for Bloch wavefunction in the commonly used form) exhibits the rotation of ARPES intensity by pi/n, and that ARPES signals reveal the signs of the matrix elements in both single- and double-layer graphene. The method provides a technique to directly extract fundamental quantum electronic information on a variety of materials.