• 文献标题:   Manipulation of graphene within a scanning force microscope
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   EILERS S, RABE JP
  • 作者关键词:  
  • 出版物名称:   PHYSICA STATUS SOLIDI BBASIC SOLID STATE PHYSICS
  • ISSN:   0370-1972 EI 1521-3951
  • 通讯作者地址:   Humboldt Univ
  • 被引频次:   9
  • DOI:   10.1002/pssb.200982350
  • 出版年:   2009

▎ 摘  要

We manipulated mono- and bi-layers of graphene on oxidized silicon wafers with a scanning force microscope (SFM). Two principle effects were observed and analyzed: (1) Cutting graphene and thereby producing ribbons, and (2) turning graphene upside down. Both are attributed to the intrinsic properties of graphenes and their interaction with the underlying substrate. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim