• 文献标题:   Variable temperature Raman microscopy as a nanometrology tool for graphene layers and graphene-based devices
  • 文献类型:   Article
  • 作  者:   CALIZO I, MIAO F, BAO W, LAU CN, BALANDIN AA
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Univ Calif Riverside
  • 被引频次:   138
  • DOI:   10.1063/1.2771379
  • 出版年:   2007

▎ 摘  要

Raman microscopy of graphene was carried out over the temperature range from 83 to 373 K. The number of layers was independently confirmed by the quantum Hall measurements and atomic force microscopy. The values of the temperature coefficients for the G and 2D-band frequencies extracted from Raman spectra of the single-layer graphene are -(1.6+/-0.2)x10(-2) cm(-1)/K and -(3.4+/-0.4)x10(-2) cm(-1)/K, respectively. The G peak temperature coefficients of the bilayer graphene and bulk graphite are -(1.5+/-0.06)x10(-2) cm(-1)/K and -(1.1+/-0.04)x10(-2) cm(-1)/K, respectively. The results are important for the application of Raman microscopy as a nanometrology tool for the graphene-based devices operating at various temperatures. (C) 2007 American Institute of Physics.