• 文献标题:   Improved Resistive Memory Based on ZnO-Graphene Hybrids through Redox Process of Graphene Quantum Dots
  • 文献类型:   Article
  • 作  者:   CHEN T, GAO YJ, CHEN W, ZHAO X
  • 作者关键词:   graphene quantum dot, memory device, redox processe, resistive switching, zinc oxidegraphene quantum dot hybrid
  • 出版物名称:   PHYSICA STATUS SOLIDIRAPID RESEARCH LETTERS
  • ISSN:   1862-6254 EI 1862-6270
  • 通讯作者地址:   Hebei Normal Univ
  • 被引频次:   2
  • DOI:   10.1002/pssr.201900153
  • 出版年:   2019

▎ 摘  要

Zinc oxide-graphene quantum dot (ZnO-GQD) hybrid thin films are synthesized by solution processing. Memory devices with Al/ZnO-GQD/Pt structures exhibit reliable bipolar switching performances with an excellent uniform distribution of switching parameters, ultra-low switching voltages, and high ON/OFF ratios. Compared with a pure ZnO-based device, the switching voltages of the Al/ZnO-GQD/Pt device are decreased by 75%, and its coefficient of variation is one order of magnitude lower than that of the pure ZnO-based device. X-ray photoelectron spectroscopy and Raman spectroscopy analyses reveal the reversible redox of GQDs under an applied electric field, which facilitates the formation and rupture of conductive filaments. The reversible exchange of oxygen ions between the GQDs and ZnO under an electric field guides the practical application of such hybrid materials in high-performance nonvolatile memory devices.