▎ 摘　　要

Single nitrogen (N) dopants in graphene are investigated using atomic-resolution scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS). Using an in situ heating holder at 500 degrees C provided us with clean graphene surfaces, and we demonstrate that isolated N substitutional atoms remain localized and stable in the graphene lattice even during local sp(2) bond reconstruction. The high stability of isolated N dopants enabled us to acquire 2D EELS maps with simultaneous ADF-STEM images to map out the local bonding variations. We show that a substitutional N dopant causes changes in the EELS of the carbon (C) atoms it is directly bonded to. An upshift in the pi* peak of the C K-edge EELS of similar to 0.5 eV is resolved and supported by density functional theory simulations.