• 文献标题:   Investigation of surface potentials in reduced graphene oxide flake by Kelvin probe force microscopy
  • 文献类型:   Article, Proceedings Paper
  • 作  者:   NEGISHI R, TAKASHIMA K, KOBAYASHI Y
  • 作者关键词:  
  • 出版物名称:   JAPANESE JOURNAL OF APPLIED PHYSICS
  • ISSN:   0021-4922 EI 1347-4065
  • 通讯作者地址:   Osaka Univ
  • 被引频次:   0
  • DOI:   10.7567/JJAP.57.06HD02
  • 出版年:   2018

▎ 摘  要

The surface potential (SP) of reduced graphene oxide (rGO) flakes prepared by thermal treatments of GO under several conditions was analyzed by Kelvin probe force microscopy. The low-crystalline rGO flakes in which a significant amount of oxygen functional groups and structural defects remain have a much lower SP than mechanically exfoliated graphene free from oxygen and defects. On the other hand, the highly crystalline rGO flake after a thermal treatment for the efficient removal of oxygen functional groups and healing of structural defects except for domain boundary shows SP equivalent to that of the mechanically exfoliated graphene. These results indicate that the work function of rGO is sensitively modulated by oxygen functional groups and structural defects remaining after the thermal reduction process, but is not affected significantly by the domain boundary remaining after the healing of structural defects through the thermal treatment at high temperature. (C) 2018 The Japan Society of Applied Physics