▎ 摘　　要

This paper describes a novel approach to the preparation of reduced graphene oxide films. Freestanding reduced graphene oxide (rGO) films were obtained by exposing graphene oxide films to a continuous wave laser diode and were investigated by Fourier transform infrared spectroscopy (FT-IR), scanning electron microscopy (SEM) and X-ray diffraction (XRD) to observe their different structural properties (existence of oxygen-containing functional groups, or defects). Thermal, optical, and electrical properties were also discussed along with the potential applications of reduced graphene oxide (rGO) freestanding films.