• 文献标题:   Undulation induced tuning of electron acceptance by edge-oxidized graphene oxide
  • 文献类型:   Article
  • 作  者:   GHOSH A, SETH SK, PURKAYASTHA P
  • 作者关键词:   edgeoxidized graphene oxide, singlewalled carbon nanotube, pipi stacking, fluorescence quenching, electron acceptability
  • 出版物名称:   SPECTROCHIMICA ACTA PART AMOLECULAR BIOMOLECULAR SPECTROSCOPY
  • ISSN:   1386-1425
  • 通讯作者地址:   Indian Inst Sci Educ Res IISER Kolkata
  • 被引频次:   0
  • DOI:   10.1016/j.saa.2018.06.052
  • 出版年:   2018

▎ 摘  要

Edge-oxidized graphene oxide (EOGO) nanosheets are good acceptors of electrons. We have employed a suitably designed pyrene-tailed fluorescent probe to establish that the electron acceptability of EOGO can be tuned by undulation of the GO sheet. Comparison between EOGO and single-walled carbon nanotubes (SWCNT) on electron acceptance from the probe molecule shows that the efficiency of pi-pi stacking between pyrene and the graphene sheet plays the key role. (C) 2018 Elsevier B.V. All rights reserved.