▎ 摘　　要

In the paper, the graphene oxide (GO) prepared by modified Hummers method was characterized by Raman spectrum, Fourier transform infrared spectrum (FTIR), and Atomic Force Microscopy (AFM). Using Kelvin Probe Force Microscopy (KPFM), the surface potential of GO was investigated, and it was found that the GO film exhibited the uniform surface potential distribution. The surface potentials at the edges and wrinkles of GO film were much lower than that at the in-plane flat area, which is proposed to be contributed to the bonds' unsaturated and disorder at these zones. These results provide insight into understanding electronic properties of GO-based composites and devices.