• 文献标题:   Molecular beam epitaxy growth and scanning tunneling microscopy study of 2D layered materials on epitaxial graphene/silicon carbide
  • 文献类型:   Review
  • 作  者:   LU H, LIU WJ, WANG HL, LIU X, ZHANG YQ, YANG DR, PI XD
  • 作者关键词:   molecular beam epitaxy, epitaxial graphene, silicon carbide, scanning tunneling microscopy, spectroscopy, twodimensional layered material
  • 出版物名称:   NANOTECHNOLOGY
  • ISSN:   0957-4484 EI 1361-6528
  • 通讯作者地址:  
  • 被引频次:   0
  • DOI:   10.1088/1361-6528/acae28
  • 出版年:   2023

▎ 摘  要

Since the advent of atomically flat graphene, two-dimensional (2D) layered materials have gained extensive interest due to their unique properties. The 2D layered materials prepared on epitaxial graphene/silicon carbide (EG/SiC) surface by molecular beam epitaxy (MBE) have high quality, which can be directly applied without further transfer to other substrates. Scanning tunneling microscopy and spectroscopy (STM/STS) with high spatial resolution and high-energy resolution are often used to study the morphologies and electronic structures of 2D layered materials. In this review, recent progress in the preparation of various 2D layered materials that are either monoelemental or transition metal dichalcogenides on EG/SiC surface by MBE and their STM/STS investigations are introduced.