▎ 摘　　要

Field-emission resonances (FERs) can be used to map the work function of a conducting surface with a high spatial resolution. While FERs have been measured on different graphene systems, measurements on graphene transferred on insulating substrates have not been carried out previously. Here we have measured FERs on graphene transferred on hexagonal boron nitride (h-BN) and silicon dioxide (SiO2) substrates. We have also developed a simple 1D model that can be used to directly interpret the constant current spectroscopy experiments. On both surfaces, FERs can be used to map the local work function changes.