▎ 摘　　要

The paper presents the results of investigation of a graphene coating produced on different substrates, such as diamond, cubic boron nitride, and silicon oxide. Characterization of the presence of graphene structures is performed by Raman spectroscopy and X-ray diffraction study. The surface topography is studied by optical, electron, and tunneling microscopes. Functionalities of all the experimental techniques applied are discussed. The results obtained by a new instrument-a tunneling microscope fitted with a tip of boron-doped semiconductor diamond-are analyzed.