• 文献标题:   Low Resistance Metal Contacts to MoS2 Devices with Nickel-Etched-Graphene Electrodes
  • 文献类型:   Article
  • 作  者:   LEONG WS, LUO X, LI YD, KHOO KH, QUEK SY, THONG JTL
  • 作者关键词:   transition metal dichalcogenide, molybdenum disulfide, contact resistance graphene, fieldeffect transistor, heterostructure
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851 EI 1936-086X
  • 通讯作者地址:   Natl Univ Singapore
  • 被引频次:   107
  • DOI:   10.1021/nn506567r
  • 出版年:   2015

▎ 摘  要

We report an approach to achieve low-resistance contacts to MoS2 transistors with the intrinsic performance of the MoS2 channel preserved. Through a dry transfer technique and a metal-catalyzed graphene treatment process, nickel-etched-graphene electrodes were fabricated on MoS2 that yield contact resistance as low as 200 Omega center dot mu m. The substantial contact enhancement (similar to 2 orders of magnitude), as compared to pure nickel electrodes, is attributed to the much smaller work function of nickel-graphene electrodes, together with the fact that presence of zigzag edges in the treated graphene surface enhances tunneling between nickel and graphene. To this end, the successful fabrication of a clean grapheneMoS(2) interface and a low resistance nickelgraphene interface is critical for the experimentally measured low contact resistance. The potential of using graphene as an electrode interlayer demonstrated in this work paves the way toward achieving high performance next-generation transistors.