• 文献标题:   The influence of substrate temperature on growth of para-sexiphenyl thin films on Ir{111} supported graphene studied by LEEM
  • 文献类型:   Article
  • 作  者:   KHOKHAR FS, HLAWACEK G, VAN GASTEL R, ZANDVLIET HJW, TEICHERT C, POELSEMA B
  • 作者关键词:   graphene, low energy electron microscope leem, selfassembly, organic thin film, sexiphenyl 6p, leed, iridium
  • 出版物名称:   SURFACE SCIENCE
  • ISSN:   0039-6028
  • 通讯作者地址:   Univ Twente
  • 被引频次:   16
  • DOI:   10.1016/j.susc.2011.11.012
  • 出版年:   2012

▎ 摘  要

The growth of para-sexiphenyl (6P) thin films as a function of substrate temperature on Ir{111} supported graphene flakes has been studied in real-time with Low Energy Electron Microscopy (LEEM). Micro Low Energy Electron Diffraction (mu LEED) has been used to determine the structure of the different 6P features formed on the surface. We observe the nucleation and growth of a wetting layer consisting of lying molecules in the initial stages of growth. Graphene defects - wrinkles - are found to be preferential sites for the nucleation of the wetting layer and of the 6P needles that grow on top of the wetting layer in the later stages of deposition. The molecular structure of the wetting layer and needles is found to be similar. As a result, only a limited number of growth directions are observed for the needles. In contrast, on the bare Ir{111} surface 6P molecules assume an upright orientation. The formation of ramified islands is observed on the bare Ir{111} surface at 320 K and 352 K, whereas at 405 K the formation of a continuous layer of upright standing molecules growing in a step flow like manner is observed. (C) 2011 Elsevier B.V. All rights reserved.