• 文献标题:   Phase Shift Induced by Gate-Controlled Quantum Capacitance in Graphene
  • 文献类型:   Article
  • 作  者:   LI JQ, MAO XR, GU XW, XIE S, GENG ZX, CHEN HD
  • 作者关键词:   logic gate, quantum capacitance, graphene, electrode, phase measurement, voltage control, cutoff frequency, gfet, phase characteristic, phase shift, quantum capacitance, smallsignal distribution model
  • 出版物名称:   IEEE ELECTRON DEVICE LETTERS
  • ISSN:   0741-3106 EI 1558-0563
  • 通讯作者地址:  
  • 被引频次:   2
  • DOI:   10.1109/LED.2021.3062367
  • 出版年:   2021

▎ 摘  要

The gate-controlled quantum capacitance and the channel resistance play an important role in the performance of graphene field-effect transistors (GFETs). This paper experimentally verifies that the output phase of the graphene field-effect transistor changes under the influence of quantum capacitance and the channel resistance, which are controlled by the gate voltage. This phenomenon is theoretically analyzed, and a model is established to simulate the phase shift. The obtained simulation results of the model are in good agreement with the experimental results. This work reveals the influence of gate voltage variation on the phase characteristics of GFETs and provides a research basis for the application of GFETs in phase shifter and the establishment of the small-signal model.