▎ 摘　　要

We show that optical reflection microscopy is a reliable method to simultaneously locate and count graphene layers deposited on bulk, transparent substrates such as soda-lime glass. The visible contrast in optical reflection versus graphene layer number is resolvable on bulk substrates. A simple Fresnel theory based on the universal optical conductance of graphene layers accurately models optical reflection images taken at a wavelength of 550 +/- 5 nm. We directly count one to nine layers of graphene using reflection microscopy.