• 文献标题:   Graphene-edge probes for scanning tunneling microscopy
  • 文献类型:   Article
  • 作  者:   CHU KKW, CHEN JS, CHANG LD, TSAI JTH
  • 作者关键词:   scanning tunneling microscope, graphene, field emission
  • 出版物名称:   OPTIK
  • ISSN:   0030-4026
  • 通讯作者地址:   Natl Taiwan Ocean Univ
  • 被引频次:   1
  • DOI:   10.1016/j.ijleo.2016.11.022
  • 出版年:   2017

▎ 摘  要

Freestanding graphene-edge probes for scanning tunneling microscopy were demonstrated. Graphene was prepared on a Cu wire by thermal chemical vapor deposition (CVD) from solid carbon sources. Follow by a mechanical cutting prbcess which was controlled by a micromanipulator and an optical microscope. The freestanding graphene probes were then fabricated. Our previous study of electron emission patterns from a field emission microscope demonstrated the layered structure of the graphene edge. We found that a single-layer of graphene emitted electrons comes from a limited number of atoms only when the graphene probe was conditioning carefully to achieve a stable emission current. In this research, we applied such activated graphene probes for use in scanning tunneling microscopes for surface morphology detection. The preconditioned, multi-layer graphene probe presented well resolution that was comparable to conventional Pt-Ir probes. Our study generated a practical method for applying individual freestanding graphene for surface probe microscopy with a cost effective process. (C) 2016 Elsevier GmbH. All rights reserved.