• 文献标题:   Reduced graphene oxide based supercapacitors: Study of self-discharge mechanisms, leakage current and stability via voltage holding tests
  • 文献类型:   Article
  • 作  者:   MISHRA RK, CHOI GJ, SOHN Y, LEE SH, GWAG JS
  • 作者关键词:   reduced graphene oxide, stability, voltage holding test, selfdischarge, leakage current
  • 出版物名称:   MATERIALS LETTERS
  • ISSN:   0167-577X EI 1873-4979
  • 通讯作者地址:   Yeungnam Univ
  • 被引频次:   3
  • DOI:   10.1016/j.matlet.2019.06.073
  • 出版年:   2019

▎ 摘  要

Herein, we report the electrochemical properties such as self-discharge, leakage current and voltage holding tests (VHTs) of reduced graphene oxide (RGO) based solid-state symmetric supercapacitors (SSCs). SSC device demonstrates wide potential window (1.2 V), high specific capacity of 110.3 mA h g(-1) at 1 A g(-1), high energy density of 22.1 W h kg(-1) and ultra-high power density of 7304.5 W kg(-1) . Further, SSC device depicts the high stability of 89.4% after 10,000 galvanostatic charge/discharge (GCD) cycles and 82.3% after 20 h VHTs. It also shows the small leakage current of 0.029 mA. Furthermore, SSC device retains the voltage of 0.7 V of its initial voltage (1.2 V) after 1 h self-discharge test, which suggests good state of health of the SSC device. (C) 2019 Elsevier B.V. All rights reserved.