• 文献标题:   An Exchange Intercalation Mechanism for the Formation of a Two-Dimensional Si Structure Underneath Graphene
  • 文献类型:   Article
  • 作  者:   CUI Y, GAO JF, JIN L, ZHAO JJ, TAN DL, FU Q, BAO XH
  • 作者关键词:   graphene, photoemission electron microscopy peem, low energy electron microscopy leem, intercalation, silicon, ru 0001
  • 出版物名称:   NANO RESEARCH
  • ISSN:   1998-0124 EI 1998-0000
  • 通讯作者地址:   Chinese Acad Sci
  • 被引频次:   53
  • DOI:   10.1007/s12274-012-0215-4
  • 出版年:   2012

▎ 摘  要

A two-dimensional (2D) Si film can form between a graphene overlayer and a Ru(0001) substrate through an intercalation process. At the graphene/2D-Si/Ru(0001) surface, the topmost graphene layer is decoupled from the Ru substrate and becomes quasi-freestanding. The interfacial Si layers show high stability due to the protection from the graphene cover. Surface science measurements indicate that the surface Si atoms can penetrate through the graphene lattice, and density functional theory calculations suggest a Si-C exchange mechanism facilitates the penetration of Si at mild temperatures. The new mechanism may be involved for other elements on graphene, if they can bond strongly with carbon. This finding opens a new route to form 2D interfacial layers between graphene and substrates.