• 文献标题:   Temperature-Triggered Sulfur Vacancy Evolution in Monolayer MoS2/Graphene Heterostructures
  • 文献类型:   Article
  • 作  者:   LIU MX, SHI JP, LI YC, ZHOU XB, MA DL, QI Y, ZHANG YF, LIU ZF
  • 作者关键词:  
  • 出版物名称:   SMALL
  • ISSN:   1613-6810 EI 1613-6829
  • 通讯作者地址:   Peking Univ
  • 被引频次:   15
  • DOI:   10.1002/smll.201602967
  • 出版年:   2017

▎ 摘  要

The existence of defects in 2D semiconductors has been predicted to generate unique physical properties and markedly influence their electronic and optoelectronic properties. In this work, it is found that the monolayer MoS2 prepared by chemical vapor deposition is nearly defect-free after annealing under ultrahigh vacuum conditions at approximate to 400 K, as evidenced by scanning tunneling microscopy observations. However, after thermal annealing process at approximate to 900 K, the existence of dominant single sulfur vacancies and relatively rare vacancy chains (2S, 3S, and 4S) is convinced in monolayer MoS2 as-grown on Au foils. Of particular significance is the revelation that the versatile vacancies can modulate the band structure of the monolayer MoS2, leading to a decrease of the bandgap and an obvious n-doping effect. These results are confirmed by scanning tunneling spectroscopy data as well as first-principles theoretical simulations of the related morphologies and the electronic properties of the various defect types. Briefly, this work should pave a novel route for defect engineering and hence the electronic property modulation of three-atom-thin 2D layered semiconductors.