▎ 摘　　要

We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from (n) over tilde (g) = 2.4-1.0i at 532 nm to (n) over tilde (g) = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42i from 532 nm to 633 nm). (C) 2008 Optical Society of America