• 文献标题:   Direct Growth of Graphene Nanowalls on Silicon Using Plasma-Enhanced Atomic Layer Deposition for High-Performance Si-Based Infrared Photodetectors
  • 文献类型:   Article
  • 作  者:   CONG JK, KHAN A, LI JJ, WANG Y, XU MS, YANG DR, YU XG
  • 作者关键词:   plasmaenhanced atomic layer deposition, graphene nanowall, silicon, infrared photodetector, schottky junction
  • 出版物名称:   ACS APPLIED ELECTRONIC MATERIALS
  • ISSN:  
  • 通讯作者地址:  
  • 被引频次:   8
  • DOI:   10.1021/acsaelm.1c00807
  • 出版年:   2021

▎ 摘  要

Development of materials and structures for cost-effective and room-temperature-operated infrared photodetectors (PDs) is highly required for security, telecommunications, and environmental sensing fields. Here, we report a method to directly grow large-area graphene nanowalls (GNWs) on the Si substrate by using the plasma-enhanced atomic layer deposition (PEALD) technique and high-performance GNWs-Si heterostructure infrared PDs based on the GNWs. We develop a PEALD protocol by using benzene as the carbon source and formic acid that provides oxygen to assist GNW growth on the Si substrate. Our PEALD-grown GNWs exhibits much better light absorption and in-plane electrical properties as compared to the GNW grown by conventional methods on the Si substrate. Our simple GNW-Si Schottky junction-based self-powered infrared PD exhibits a high responsivity of 15 mA/W at 1342 nm, a fast response speed of 43 mu s for rise time and 69 mu s for decay time, and a high specific detectivity of 1.5 x 10(11) cm Hz(1/2)/W under a test condition of 10,000 Hz. Our study opens a promising venue to directly grow graphene materials on Si for Si-based optoelectronics.