• 文献标题:   Edge Effect on the Photodetection Ability of the Graphene Nanocrystallites Embedded Carbon Film Coated on p-Silicon
  • 文献类型:   Article
  • 作  者:   ZHANG X, PENG D, LIN ZZ, CHEN WC, DIAO DF
  • 作者关键词:   carbon film, edge quantum trapping, graphene nanocrystallite, heterojunction, photoelectric response
  • 出版物名称:   PHYSICA STATUS SOLIDIRAPID RESEARCH LETTERS
  • ISSN:   1862-6254 EI 1862-6270
  • 通讯作者地址:   Shenzhen Univ
  • 被引频次:   2
  • DOI:   10.1002/pssr.201800511
  • 出版年:   2019

▎ 摘  要

A sensitive photodetector of graphene nanocrystallites embedded carbon (GNEC) film coated on p-silicon has been proposed. Different from the conventional growth mode of graphene, GNEC film contains a large amount of vertically grown graphene nanocrystallites (GNs). Edges of GNs act as electron trapping centers, increasing the ability to capture electrons. Different types of films are prepared under various deposition biases (20, 40, 60, and 80 V), which have different density of edges (N-edge). Edge entrapment improves the photocurrent responsivity of 40 V film (high N-edge) to 0.401 A W-1, compared with 0.126 A W-1 of 20 V film (amorphous, no N-edge) and 0.194 A W-1 of 80 V film (low N-edge). A high specific detectivity of 1.34 x 10(12) cm Hz(1/2) W-1 is exhibited at zero bias. GNs maintain a charge transport channel, which makes it have a fast response time tau(rise) = 260 ns.