• 文献标题:   Universal scaling of resistivity in bilayer graphene
  • 文献类型:   Article
  • 作  者:   GOPINADHAN K, SHIN YJ, YANG H
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951 EI 1077-3118
  • 通讯作者地址:   Natl Univ Singapore
  • 被引频次:   5
  • DOI:   10.1063/1.4769042
  • 出版年:   2012

▎ 摘  要

We report the temperature dependent electrical transport properties of gated bilayer graphene devices. We see a clear evidence of insulating behavior due to electron-hole charge puddles. The electrical resistivity increases while the mobility decreases with decreasing temperature, a characteristic due to carrier inhomogeneity in graphene. The theoretical fittings using an empirical formula of single electron tunneling indicate that electrical resistivity follows a universal curve with a scaling parameter. The scaling parameter is determined to be a measure of the fluctuations in the electron-hole puddle distribution. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769042]