• 文献标题:   Graphene-metal contact resistivity on semi-insulating 6H-SiC(0001) measured with Kelvin probe force microscopy
  • 文献类型:   Article
  • 作  者:   DRUGA T, WENDEROTH M, LUPKE F, ULBRICH RG
  • 作者关键词:  
  • 出版物名称:   APPLIED PHYSICS LETTERS
  • ISSN:   0003-6951
  • 通讯作者地址:   Univ Gottingen
  • 被引频次:   7
  • DOI:   10.1063/1.4816955
  • 出版年:   2013

▎ 摘  要

We present Kelvin probe force microscopy measurements and resistance network simulations of the lateral charge transport across few-layer graphene on the semi-insulating 6H-SiC(0001) surface. After preparation of the SiC crystal by thermal decomposition, gold electrodes were prepared on the top of the graphene layers. The transport field is extracted by subtracting measurements of reverse lateral bias applied to the gold electrodes. Graphene sheet resistances as low as 0: 75 k Omega/sq were observed. By comparing the experimental transport measurements with a resistance network simulation the contact resistivity between graphene and a gold electrode can be determined to be < 1 x 10(-6) Omega cm(2). (C) 2013 AIP Publishing LLC.