• 文献标题:   Investigation the interaction between the pulsed ultraviolet laser beams and PEDOT:PSS/graphene composite films
  • 文献类型:   Article
  • 作  者:   TSENG SF, HSIAO WT, CHUNG CK, CHANG TL
  • 作者关键词:   ultraviolet laser, pedot:pss/graphene composite film, ablated line, microstructuring electrode, edge quality
  • 出版物名称:   APPLIED SURFACE SCIENCE
  • ISSN:   0169-4332 EI 1873-5584
  • 通讯作者地址:   Natl Appl Res Labs
  • 被引频次:   5
  • DOI:   10.1016/j.apsusc.2015.08.131
  • 出版年:   2015

▎ 摘  要

This research aims to investigate the interaction between pulsed ultraviolet (UV) laser beams and transparent PEDOT:PSS/graphene composite films. The laser ablated microstructure on film surfaces provides the electrical isolation and prevents the electrical contact from each location for the projected capacitive touch screen. Before the laser processing, the surface roughness, microhardness, spectrum and cross-sectional view of PEDOT:PSS/graphene composite film were measured by an atomic force microscope, a nanoindenter, a spectrometer and a scanning electron microscope, respectively. The focused UV laser beam was irradiated along line patterns with an overlapping rate of 60% and the applied laser fluences much over the ablation thresholds of 1.27 J/cm(2) to 3.82 J/cm(2). The surface morphology, three-dimensional topography, and cross-sectional profile of isolated lines and electrode structures after laser microstructuring were measured by a confocal laser scanning microscope. By increasing the laser fluence from 1.27 J/cm(2) to 3.82 J/cm(2), the ablated line widths and depths increased from 12.17 +/- 0.24 mu m to 21 +/- 0.37 mu m and from 190 +/- 9 nm to 227 +/- 15 nm, respectively. Moreover, the ablated lines of microstructuring electrodes had a clear and regular ablated edge quality. (C) 2015 Elsevier B.V. All rights reserved.