• 文献标题:   Robust Graphene Membranes in a Silicon Carbide Frame
  • 文献类型:   Article
  • 作  者:   WALDMANN D, BUTZ B, BAUER S, ENGLERT JM, JOBST J, ULLMANN K, FROMM F, AMMON M, ENZELBERGEE M, HIRSCH A, MAIER S, SCHMUKI P, SEYLLER T, SPIECKER E, WEBERT HB
  • 作者关键词:   epitaxial graphene, membrane, photoassisted etching, raman spectroscopy, transmission electron microscopy
  • 出版物名称:   ACS NANO
  • ISSN:   1936-0851
  • 通讯作者地址:   Univ Erlangen Nurnberg
  • 被引频次:   14
  • DOI:   10.1021/nn401037c
  • 出版年:   2013

▎ 摘  要

We present a fabrication process for freely suspended membranes consisting of bi- and trilayer graphene grown on silicon carbide. The procedure, involving photoelectrochemical etching, enables the simultaneous fabrication of hundreds of arbitrarily shaped membranes with an area up to 500 mu m(2) and a yield or around 90%. Micro-Raman and atomic force microscopy measurements confirm that the graphene layer withstands the electrochemical etching and show that the membranes are virtually unstrained. The process delivers membranes with a cleanliness suited for high-resolution transmission electron microscopy (HRTEM) at atomic scale. The membrane, and its frame, is very robust with respect to thermal cycling above 1000 C as well as harsh acidic or alkaline treatment.