• 文献标题:   Single step fabrication of N-doped graphene/Si3N4/SiC heterostructures
  • 文献类型:   Article
  • 作  者:   VELEZFORT E, PALLECCHI E, SILLY MG, BAHRI M, PATRIARCHE G, SHUKLA A, SIROTTI F, OUERGHI A
  • 作者关键词:   epitaxial graphene, spectroscopy, nitrogendoped graphene, lowenergy electron microscopy, electronic propertie
  • 出版物名称:   NANO RESEARCH
  • ISSN:   1998-0124 EI 1998-0000
  • 通讯作者地址:   CNRS
  • 被引频次:   13
  • DOI:   10.1007/s12274-014-0444-9
  • 出版年:   2014

▎ 摘  要

In-plane heteroatom substitution of graphene is a promising strategy to modify its properties. The ability to dope graphene with electron-donor nitrogen heteroatoms is highly important for modulating electrical properties of graphene. Here we demonstrate a transfer-free method to directly grow large area quasi free-standing N-doped graphene bilayers on an insulating substrate (Si3N4). Electron-bombardment heating under nitrogen flux results in simultaneous growth of N-doped graphene and a Si3N4 layer on the SiC surface. The decoupling of N-doped graphene from the substrate and the presence of Si3N4 are identified by X-ray photoemission spectroscopy and low-energy electron diffraction. The substitution of nitrogen atoms in the graphene planes was confirmed using high resolution X-ray photoemission spectroscopy which reveals several atomic configurations for the nitrogen atoms: Graphitic-like, pyridine-like, and pyrrolic-like. Furthermore, we demonstrated for the first time that N-doped graphene could be used to efficiently probe oxygen molecules via nitrogen atom defects.