• 文献标题:   Single Defect Center Scanning Near-Field Optical Microscopy on Graphene
  • 文献类型:   Article
  • 作  者:   TISLER J, OECKINGHAUS T, STOHR RJ, KOLESOV R, REUTER R, REINHARD F, WRACHTRUP J
  • 作者关键词:   scanning nearfield optical microscopy, scanning probe, fret, graphene, nitrogenvacancy center, nanodiamond
  • 出版物名称:   NANO LETTERS
  • ISSN:   1530-6984 EI 1530-6992
  • 通讯作者地址:   Univ Stuttgart
  • 被引频次:   43
  • DOI:   10.1021/nl401129m
  • 出版年:   2013

▎ 摘  要

We present a scanning-probe microscope based on an atomic-size emitter, a single nitrogen-vacancy center in a nanodiamond. We employ this tool to quantitatively map the near-field coupling between the NV center and a flake of graphene in three dimensions with nanoscale resolution. Further we demonstrate universal energy transfer distance scaling between a point-like atomic emitter and a two-dimensional acceptor. Our study paves the way toward a versatile single emitter scanning microscope, which could image and excite molecular-scale light fields in photonic nanostructures or single fluorescent molecules.