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  • 文献标题:   Conductance images between two STM probes in graphene
  • 文献类型:   Article, Proceedings Paper
  • 作　　者:   NAKANISHI T, ANDO T
  • 作者关键词:   graphite, carbon nanotube, multiprobe stm, kekuletype pattern, quantum interference
  • 出版物名称:   PHYSICA ELOWDIMENSIONAL SYSTEMS NANOSTRUCTURES
  • ISSN:   1386-9477
  • 通讯作者地址:   AIST
  • 被引频次:   5
  • DOI:   10.1016/j.physe.2009.10.041
  • 出版年:   2010

▎ 摘　　要

The conductance image between two probes of scanning-tunneling-microscopy (STM) is calculated in a graphene within a tight-binding model and a realistic model for STM probes. A Kekule-type pattern appears due to interference of states at K and K' points. (C) 2009 Elsevier B.V. All rights reserved.